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Date: 2004
Language: en
Type of item: journal article
Identifier: pes:7237
Description: Triple-crystal X-ray diffractometry is widely used for the analysis of structural characteristics of single crystals and heteroepitaxial structures. Different theoretical approaches taking into accoun ... show more
Refereed: Refereed
Date: 2004
Language: en
Type of item: journal article
Identifier: pes:7230
Description: Weissenberg screens and a translating cassette have been employed to allow an imaging plate to collect 30 scans per readout. In this configuration the imaging plate functions as a curved one-dimension ... show more
Refereed: Refereed
Date: 2003
Language: en
Type of item: journal article
Identifier: pes:7235
Description: GaInN is an important wide band gap material with applications in short wavelength optoelectronic devices. The GaInN layer is often grown on a sapphire substrate, with low-temperature-deposited AlN an ... show more
Refereed: Refereed
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